Fine Pitch Probe
Test Probe
Test Probe
MODEL : 61-011040-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Single Probe | |
MATERIAL & FINISH
| Barrel | Ni-Au Tube, Au Plated | |
| Plunger-Top | W Alloy, Nt Plated | |
| Plunger-Bottom | W Alloy, Nt Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 7.5gf @ 0.30mm | |
| Maximum | 9.2gf @ 0.40mm | |
| Pointing Accuracy | ±0.05 |
MODEL : 60-026046-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Double Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | Hardened BeCu, Au Plated | |
| Spring | Stainless Steel, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 14.8gf @ 0.40mm | |
| Maximum | 20.7gf @ 0.60mm | |
| Pointing Accuracy | ±0.05 |
MODEL : 60-038057-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Double Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | Hardened BeCu, Au Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 24.6gf @ 0.65mm | |
| Maximum | 27.7gf @ 0.80mm | |
| Pointing Accuracy | ±0.05 |
MODEL : 60-053057-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Double Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | Hardened BeCu, Au Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 33.5gf @ 0.97mm | |
| Maximum | 37.6gf @ 1.15mm | |
| Pointing Accuracy | ±0.06 |
MODEL : 60-025038-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Double Probe | |
MATERIAL & FINISH
| Barrel | Ni-Au Tube, Au Plated | |
| Plunger-Top | W Alloy, Nt Plated | |
| Plunger-Bottom | W Alloy, Nt Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 23.2gf @ 0.50mm | |
| Maximum | 25.0gf @ 0.60mm | |
| Pointing Accuracy | ±0.05 |
MODEL : 60-050063-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Double Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardned BeCu, Au Plated | |
| Plunger-Bottom | Hardned BeCu, Au Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 10.1gf @ 1.00mm | |
| Maximum | 14.7gf @ 1.60mm | |
| Pointing Accuracy | ±0.05 |
MODEL : 61-026033-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Single Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | Hardened BeCu, Au Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 20.5gf @ 0.38mm | |
| Maximum | 25.6gf @ 0.50mm | |
| Pointing Accuracy | ±0.05 |
MODEL : 61-038028-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Single Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | Hardened BeCu, Au Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 24.7gf @ 0.38mm | |
| Maximum | 30.9gf @ 0.50mm | |
| Pointing Accuracy | ±0.05 |
MODEL : 61-057059-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Single Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | Hardened BeCu, Au Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 35.8gf @ 0.74mm | |
| Maximum | 45.0gf @ 1.00mm | |
| Pointing Accuracy | ±0.05 |
MODEL : 61-031047-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Single Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | W Alloy, Nt Plated | |
| Plunger-Bottom | Hardned BeCu, Au Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 25.2gf @ 0.50mm | |
| Maximum | 32.2gf @ 0.65mm | |
| Pointing Accuracy | ±0.06 |
MODEL : 61-038055-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Kelvin Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | Hardened BeCu, Au Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 31.0gf @ 0.45mm | |
| Maximum | 37.6gf @ 0.60mm | |
| Pointing Accuracy | ±0.05 |
I-3 COATING PROBE
This technology has very low impact on EOS/ESD
and reducing the cleaning cycle by preventing from Sn transition to extend life span of Tip
Au Probe
※ Sn Solder Pot Wetting Test (300℃)
I-3 Coating Probe
※ Sn Solder Pot Wetting Test (300℃)
I-1 COATING PROBE
Technology to delay the oxidation rate through the harsh
electrolytic test as shown below
Au Probe
I-1 Coating Probe
