Etc. Probe
Test Probe
Test Probe
- Etc. Probe
- Double Probe
- Single Probe
- Out Spring Probe
- ICT Probe
- Kelvin Probe
- Fine Pitch Probe
- Coating Probe
MODEL : 6Y-160180-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Rubber Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | Hardened BeCu, Au Plated | |
| Spring | Sillicone, Nt Plated | |
MECHANICAL SPECIFICATIONS
| Working | 41.5gf @ 0.50mm Recommend Travel | |
| Maximum | 105.4gf @ 1.00mm Full Travel | |
| Pointing Accuracy | ±0.05 |
MODEL : –
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Chuck Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Spring | Music Wire, Nt Plated | |
MECHANICAL SPECIFICATIONS
| Working | 119.4gf @ 4.00mm Recommend Travel | |
| Maximum | 181.8gf @ 6.35mm Full Travel | |
| Pointing Accuracy | ±0.05 |
MODEL : 60-026046-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Double Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | Hardened BeCu, Au Plated | |
| Spring | Stainless Steel, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 14.8gf @ 0.40mm | |
| Maximum | 20.7gf @ 0.60mm | |
| Pointing Accuracy | ±0.05 |
MODEL : 60-038057-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Double Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | Hardened BeCu, Au Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 24.6gf @ 0.65mm | |
| Maximum | 27.7gf @ 0.80mm | |
| Pointing Accuracy | ±0.05 |
MODEL : 60-053057-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Double Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | Hardened BeCu, Au Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 33.5gf @ 0.97mm | |
| Maximum | 37.6gf @ 1.15mm | |
| Pointing Accuracy | ±0.06 |
MODEL : 60-025038-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Double Probe | |
MATERIAL & FINISH
| Barrel | Ni-Au Tube, Au Plated | |
| Plunger-Top | W Alloy, Nt Plated | |
| Plunger-Bottom | W Alloy, Nt Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 23.2gf @ 0.50mm | |
| Maximum | 25.0gf @ 0.60mm | |
| Pointing Accuracy | ±0.05 |
MODEL : 60-050063-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Double Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardned BeCu, Au Plated | |
| Plunger-Bottom | Hardned BeCu, Au Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 10.1gf @ 1.00mm | |
| Maximum | 14.7gf @ 1.60mm | |
| Pointing Accuracy | ±0.05 |
MODEL : 61-026033-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Single Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | Hardened BeCu, Au Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 20.5gf @ 0.38mm | |
| Maximum | 25.6gf @ 0.50mm | |
| Pointing Accuracy | ±0.05 |
MODEL : 61-038028-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Single Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | Hardened BeCu, Au Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 24.7gf @ 0.38mm | |
| Maximum | 30.9gf @ 0.50mm | |
| Pointing Accuracy | ±0.05 |
MODEL : 61-057059-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Single Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | Hardened BeCu, Au Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 35.8gf @ 0.74mm | |
| Maximum | 45.0gf @ 1.00mm | |
| Pointing Accuracy | ±0.05 |
MODEL : 61-031047-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Single Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | W Alloy, Nt Plated | |
| Plunger-Bottom | Hardned BeCu, Au Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 25.2gf @ 0.50mm | |
| Maximum | 32.2gf @ 0.65mm | |
| Pointing Accuracy | ±0.06 |
MODEL : 63-026045-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Out Spring Probe | |
MATERIAL & FINISH
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | W Alloy, Nt Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 19.7gf @ 0.60mm | |
| Maximum | 24.6gf @ 0.75mm | |
| Pointing Accuracy | – |
MODEL : 63-038028-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Out Spring Probe | |
MATERIAL & FINISH
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | W Alloy, Nt Plated | |
| Spring | Stainless Steel, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 30.6gf @ 0.38mm | |
| Maximum | 41.1gf @ 0.51mm | |
| Pointing Accuracy | – |
MODEL : 63-056030-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Out Spring Probe | |
MATERIAL & FINISH
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | W Alloy, Nt Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 28.4gf @ 0.38mm | |
| Maximum | 38.1gf @ 0.51mm | |
| Pointing Accuracy | – |
PROBE : 64-061359-00
RECEPTACLE : 66-167300-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | ICT Probe | |
MATERIAL & FINISH
| Barrel | Brass Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Spring | Music Wire, Nt Plated | |
| Receptacle | Brass Tube, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 102.4gf @ 4.30mm Recommend Travel | |
| Maximum | 140.9gf @ 6.35mm Full Travel |
PROBE : 64-078432-00
RECEPTACLE : 66-095406-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | ICT Probe | |
MATERIAL & FINISH
| Barrel | Brass Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Spring | Music Wire, Nt Plated | |
| Receptacle | Brass Tube, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 154.0gf @ 4.30mm Recommend Travel | |
| Maximum | 210.4gf @ 6.35mm Full Travel |
PROBE : 64-102351-00
RECEPTACLE : 66-132302-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | ICT Probe | |
MATERIAL & FINISH
| Barrel | Brass Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Spring | Music Wire, Nt Plated | |
| Receptacle | Brass Tube, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 148.9gf @ 4.30mm Recommend Travel | |
| Maximum | 201.5gf @ 6.35mm Full Travel |
PROBE : 64-137354-00
RECEPTACLE : 66-167300-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | ICT Probe | |
MATERIAL & FINISH
| Barrel | Brass Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Spring | Music Wire, Nt Plated | |
| Receptacle | Brass Tube, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 148.9gf @ 4.30mm Recommend Travel | |
| Maximum | 201.5gf @ 6.35mm Full Travel |
MODEL : 61-038055-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Kelvin Probe | |
MATERIAL & FINISH
| Barrel | Phosphor Bronze Tube, Au Plated | |
| Plunger-Top | Hardened BeCu, Au Plated | |
| Plunger-Bottom | Hardened BeCu, Au Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 31.0gf @ 0.45mm | |
| Maximum | 37.6gf @ 0.60mm | |
| Pointing Accuracy | ±0.05 |
MODEL : 61-011040-00
CLASSIFICATION
| Application | Semiconductor Test | |
| Probe Type | Single Probe | |
MATERIAL & FINISH
| Barrel | Ni-Au Tube, Au Plated | |
| Plunger-Top | W Alloy, Nt Plated | |
| Plunger-Bottom | W Alloy, Nt Plated | |
| Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
| Working | 7.5gf @ 0.30mm | |
| Maximum | 9.2gf @ 0.40mm | |
| Pointing Accuracy | ±0.05 |
I-3 COATING PROBE
This technology has very low impact on EOS/ESD
and reducing the cleaning cycle by preventing from Sn transition to extend life span of Tip
Au Probe
※ Sn Solder Pot Wetting Test (300℃)
I-3 Coating Probe
※ Sn Solder Pot Wetting Test (300℃)
I-1 COATING PROBE
Technology to delay the oxidation rate through the harsh
electrolytic test as shown below
Au Probe
I-1 Coating Probe
Product Inquiry
You can see in the future FineOhms
FineOhms always has developed alongside with customer and by customer, for customer, we promise to do our best to make customer’s sales increase
What is the Needs and Wants ?
– long life time – High quality product
– Higher yield to device test result
– Reduce to retest test rate(first Pass Yield improve under there test process)
– Cover to High speed device test with high frequency
– Make to high performance test process
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