Etc. Probe

Test Probe
Test Probe
- Etc. Probe
- Double Probe
- Single Probe
- Out Spring Probe
- ICT Probe
- Kelvin Probe
- Fine Pitch Probe
- Coating Probe
MODEL : 6Y-160180-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | Rubber Probe | |
MATERIAL & FINISH
Barrel | Phosphor Bronze Tube, Au Plated | |
Plunger-Top | Hardened BeCu, Au Plated | |
Plunger-Bottom | Hardened BeCu, Au Plated | |
Spring | Sillicone, Nt Plated | |
MECHANICAL SPECIFICATIONS
Working | 41.5gf @ 0.50mm Recommend Travel | |
Maximum | 105.4gf @ 1.00mm Full Travel | |
Pointing Accuracy | ±0.05 |

MODEL : –
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | Chuck Probe | |
MATERIAL & FINISH
Barrel | Phosphor Bronze Tube, Au Plated | |
Plunger-Top | Hardened BeCu, Au Plated | |
Spring | Music Wire, Nt Plated | |
MECHANICAL SPECIFICATIONS
Working | 119.4gf @ 4.00mm Recommend Travel | |
Maximum | 181.8gf @ 6.35mm Full Travel | |
Pointing Accuracy | ±0.05 |

MODEL : 60-026046-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | Double Probe | |
MATERIAL & FINISH
Barrel | Phosphor Bronze Tube, Au Plated | |
Plunger-Top | Hardened BeCu, Au Plated | |
Plunger-Bottom | Hardened BeCu, Au Plated | |
Spring | Stainless Steel, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 14.8gf @ 0.40mm | |
Maximum | 20.7gf @ 0.60mm | |
Pointing Accuracy | ±0.05 |

MODEL : 60-038057-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | Double Probe | |
MATERIAL & FINISH
Barrel | Phosphor Bronze Tube, Au Plated | |
Plunger-Top | Hardened BeCu, Au Plated | |
Plunger-Bottom | Hardened BeCu, Au Plated | |
Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 24.6gf @ 0.65mm | |
Maximum | 27.7gf @ 0.80mm | |
Pointing Accuracy | ±0.05 |

MODEL : 60-053057-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | Double Probe | |
MATERIAL & FINISH
Barrel | Phosphor Bronze Tube, Au Plated | |
Plunger-Top | Hardened BeCu, Au Plated | |
Plunger-Bottom | Hardened BeCu, Au Plated | |
Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 33.5gf @ 0.97mm | |
Maximum | 37.6gf @ 1.15mm | |
Pointing Accuracy | ±0.06 |

MODEL : 60-025038-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | Double Probe | |
MATERIAL & FINISH
Barrel | Ni-Au Tube, Au Plated | |
Plunger-Top | W Alloy, Nt Plated | |
Plunger-Bottom | W Alloy, Nt Plated | |
Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 23.2gf @ 0.50mm | |
Maximum | 25.0gf @ 0.60mm | |
Pointing Accuracy | ±0.05 |

MODEL : 60-050063-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | Double Probe | |
MATERIAL & FINISH
Barrel | Phosphor Bronze Tube, Au Plated | |
Plunger-Top | Hardned BeCu, Au Plated | |
Plunger-Bottom | Hardned BeCu, Au Plated | |
Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 10.1gf @ 1.00mm | |
Maximum | 14.7gf @ 1.60mm | |
Pointing Accuracy | ±0.05 |

MODEL : 61-026033-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | Single Probe | |
MATERIAL & FINISH
Barrel | Phosphor Bronze Tube, Au Plated | |
Plunger-Top | Hardened BeCu, Au Plated | |
Plunger-Bottom | Hardened BeCu, Au Plated | |
Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 20.5gf @ 0.38mm | |
Maximum | 25.6gf @ 0.50mm | |
Pointing Accuracy | ±0.05 |

MODEL : 61-038028-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | Single Probe | |
MATERIAL & FINISH
Barrel | Phosphor Bronze Tube, Au Plated | |
Plunger-Top | Hardened BeCu, Au Plated | |
Plunger-Bottom | Hardened BeCu, Au Plated | |
Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 24.7gf @ 0.38mm | |
Maximum | 30.9gf @ 0.50mm | |
Pointing Accuracy | ±0.05 |

MODEL : 61-057059-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | Single Probe | |
MATERIAL & FINISH
Barrel | Phosphor Bronze Tube, Au Plated | |
Plunger-Top | Hardened BeCu, Au Plated | |
Plunger-Bottom | Hardened BeCu, Au Plated | |
Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 35.8gf @ 0.74mm | |
Maximum | 45.0gf @ 1.00mm | |
Pointing Accuracy | ±0.05 |

MODEL : 61-031047-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | Single Probe | |
MATERIAL & FINISH
Barrel | Phosphor Bronze Tube, Au Plated | |
Plunger-Top | W Alloy, Nt Plated | |
Plunger-Bottom | Hardned BeCu, Au Plated | |
Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 25.2gf @ 0.50mm | |
Maximum | 32.2gf @ 0.65mm | |
Pointing Accuracy | ±0.06 |

MODEL : 63-026045-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | Out Spring Probe | |
MATERIAL & FINISH
Plunger-Top | Hardened BeCu, Au Plated | |
Plunger-Bottom | W Alloy, Nt Plated | |
Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 19.7gf @ 0.60mm | |
Maximum | 24.6gf @ 0.75mm | |
Pointing Accuracy | – |

MODEL : 63-038028-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | Out Spring Probe | |
MATERIAL & FINISH
Plunger-Top | Hardened BeCu, Au Plated | |
Plunger-Bottom | W Alloy, Nt Plated | |
Spring | Stainless Steel, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 30.6gf @ 0.38mm | |
Maximum | 41.1gf @ 0.51mm | |
Pointing Accuracy | – |

MODEL : 63-056030-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | Out Spring Probe | |
MATERIAL & FINISH
Plunger-Top | Hardened BeCu, Au Plated | |
Plunger-Bottom | W Alloy, Nt Plated | |
Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 28.4gf @ 0.38mm | |
Maximum | 38.1gf @ 0.51mm | |
Pointing Accuracy | – |

PROBE : 64-061359-00
RECEPTACLE : 66-167300-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | ICT Probe | |
MATERIAL & FINISH
Barrel | Brass Tube, Au Plated | |
Plunger-Top | Hardened BeCu, Au Plated | |
Spring | Music Wire, Nt Plated | |
Receptacle | Brass Tube, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 102.4gf @ 4.30mm Recommend Travel | |
Maximum | 140.9gf @ 6.35mm Full Travel |

PROBE : 64-078432-00
RECEPTACLE : 66-095406-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | ICT Probe | |
MATERIAL & FINISH
Barrel | Brass Tube, Au Plated | |
Plunger-Top | Hardened BeCu, Au Plated | |
Spring | Music Wire, Nt Plated | |
Receptacle | Brass Tube, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 154.0gf @ 4.30mm Recommend Travel | |
Maximum | 210.4gf @ 6.35mm Full Travel |

PROBE : 64-102351-00
RECEPTACLE : 66-132302-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | ICT Probe | |
MATERIAL & FINISH
Barrel | Brass Tube, Au Plated | |
Plunger-Top | Hardened BeCu, Au Plated | |
Spring | Music Wire, Nt Plated | |
Receptacle | Brass Tube, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 148.9gf @ 4.30mm Recommend Travel | |
Maximum | 201.5gf @ 6.35mm Full Travel |

PROBE : 64-137354-00
RECEPTACLE : 66-167300-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | ICT Probe | |
MATERIAL & FINISH
Barrel | Brass Tube, Au Plated | |
Plunger-Top | Hardened BeCu, Au Plated | |
Spring | Music Wire, Nt Plated | |
Receptacle | Brass Tube, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 148.9gf @ 4.30mm Recommend Travel | |
Maximum | 201.5gf @ 6.35mm Full Travel |

MODEL : 61-038055-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | Kelvin Probe | |
MATERIAL & FINISH
Barrel | Phosphor Bronze Tube, Au Plated | |
Plunger-Top | Hardened BeCu, Au Plated | |
Plunger-Bottom | Hardened BeCu, Au Plated | |
Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 31.0gf @ 0.45mm | |
Maximum | 37.6gf @ 0.60mm | |
Pointing Accuracy | ±0.05 |

MODEL : 61-011040-00
CLASSIFICATION
Application | Semiconductor Test | |
Probe Type | Single Probe | |
MATERIAL & FINISH
Barrel | Ni-Au Tube, Au Plated | |
Plunger-Top | W Alloy, Nt Plated | |
Plunger-Bottom | W Alloy, Nt Plated | |
Spring | Music Wire, Au Plated | |
MECHANICAL SPECIFICATIONS
Working | 7.5gf @ 0.30mm | |
Maximum | 9.2gf @ 0.40mm | |
Pointing Accuracy | ±0.05 |

I-3 COATING PROBE
This technology has very low impact on EOS/ESD
and reducing the cleaning cycle by preventing from Sn transition to extend life span of Tip
Au Probe

※ Sn Solder Pot Wetting Test (300℃)
I-3 Coating Probe

※ Sn Solder Pot Wetting Test (300℃)



I-1 COATING PROBE
Technology to delay the oxidation rate through the harsh
electrolytic test as shown below
Au Probe
I-1 Coating Probe

Product Inquiry
You can see in the future FineOhms
FineOhms always has developed alongside with customer and by customer, for customer, we promise to do our best to make customer’s sales increase
What is the Needs and Wants ?
– long life time – High quality product
– Higher yield to device test result
– Reduce to retest test rate(first Pass Yield improve under there test process)
– Cover to High speed device test with high frequency
– Make to high performance test process