kelvin Probe
Introduction

sub_top_img_test_probe

Test Probe

Test Probe

MODEL : 61-038055-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Kelvin Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top Hardened BeCu, Au Plated
Plunger-Bottom Hardened BeCu, Au Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 31.0gf @ 0.45mm
Maximum 37.6gf @ 0.60mm
Pointing Accuracy ±0.05
kelvin_probe_001
MODEL : 60-026046-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Double Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top Hardened BeCu, Au Plated
Plunger-Bottom Hardened BeCu, Au Plated
Spring Stainless Steel, Au Plated

MECHANICAL SPECIFICATIONS

Working 14.8gf @ 0.40mm
Maximum 20.7gf @ 0.60mm
Pointing Accuracy ±0.05
double_probe_001
MODEL : 60-038057-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Double Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top Hardened BeCu, Au Plated
Plunger-Bottom Hardened BeCu, Au Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 24.6gf @ 0.65mm
Maximum 27.7gf @ 0.80mm
Pointing Accuracy ±0.05
double_probe_002
MODEL : 60-053057-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Double Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top Hardened BeCu, Au Plated
Plunger-Bottom Hardened BeCu, Au Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 33.5gf @ 0.97mm
Maximum 37.6gf @ 1.15mm
Pointing Accuracy ±0.06
double_probe_003
MODEL : 60-025038-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Double Probe

MATERIAL & FINISH

Barrel Ni-Au Tube, Au Plated
Plunger-Top W Alloy, Nt Plated
Plunger-Bottom W Alloy, Nt Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 23.2gf @ 0.50mm
Maximum 25.0gf @ 0.60mm
Pointing Accuracy ±0.05
double_probe_004
MODEL : 60-050063-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Double Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top Hardned BeCu, Au Plated
Plunger-Bottom Hardned BeCu, Au Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 10.1gf @ 1.00mm
Maximum 14.7gf @ 1.60mm
Pointing Accuracy ±0.05
double_probe_005
MODEL : 61-026033-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Single Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top Hardened BeCu, Au Plated
Plunger-Bottom Hardened BeCu, Au Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 20.5gf @ 0.38mm
Maximum 25.6gf @ 0.50mm
Pointing Accuracy ±0.05
single_probe_001
MODEL : 61-038028-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Single Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top Hardened BeCu, Au Plated
Plunger-Bottom Hardened BeCu, Au Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 24.7gf @ 0.38mm
Maximum 30.9gf @ 0.50mm
Pointing Accuracy ±0.05
single_probe_002
MODEL : 61-057059-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Single Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top Hardened BeCu, Au Plated
Plunger-Bottom Hardened BeCu, Au Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 35.8gf @ 0.74mm
Maximum 45.0gf @ 1.00mm
Pointing Accuracy ±0.05
single_probe_003
MODEL : 61-031047-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Single Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top W Alloy, Nt Plated
Plunger-Bottom Hardned BeCu, Au Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 25.2gf @ 0.50mm
Maximum 32.2gf @ 0.65mm
Pointing Accuracy ±0.06
single_probe_004
MODEL : 61-011040-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Single Probe

MATERIAL & FINISH

Barrel Ni-Au Tube, Au Plated
Plunger-Top W Alloy, Nt Plated
Plunger-Bottom W Alloy, Nt Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 7.5gf @ 0.30mm
Maximum 9.2gf @ 0.40mm
Pointing Accuracy ±0.05
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I-3 COATING PROBE

This technology has very low impact on EOS/ESD
and reducing the cleaning cycle by preventing from Sn transition to extend life span of Tip

Au Probe

i3_coating_probe_001

※ Sn Solder Pot Wetting Test (300℃)

I-3 Coating Probe

i3_coating_probe_002

※ Sn Solder Pot Wetting Test (300℃)

i3_coating_probe_003
i3_coating_probe_004
i3_coating_probe_005
I-1 COATING PROBE

Technology to delay the oxidation rate through the harsh
electrolytic test as shown below

Au Probe

I-1 Coating Probe

i1_coating_probe_001

Product Inquiry

You can see in the future FineOhms

FineOhms always has developed alongside with customer and by customer, for customer, we promise to do our best to make customer’s sales increase

What is the Needs and Wants ?

– long life time – High quality product
– Higher yield to device test result
– Reduce to retest test rate(first Pass Yield improve under there test process)
– Cover to High speed device test with high frequency
– Make to high performance test process

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