Single Probe
Introduction

sub_top_img_test_probe

Test Probe

Test Probe

MODEL : 61-026033-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Single Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top Hardened BeCu, Au Plated
Plunger-Bottom Hardened BeCu, Au Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 20.5gf @ 0.38mm
Maximum 25.6gf @ 0.50mm
Pointing Accuracy ±0.05
single_probe_001
MODEL : 61-038028-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Single Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top Hardened BeCu, Au Plated
Plunger-Bottom Hardened BeCu, Au Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 24.7gf @ 0.38mm
Maximum 30.9gf @ 0.50mm
Pointing Accuracy ±0.05
single_probe_002
MODEL : 61-057059-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Single Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top Hardened BeCu, Au Plated
Plunger-Bottom Hardened BeCu, Au Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 35.8gf @ 0.74mm
Maximum 45.0gf @ 1.00mm
Pointing Accuracy ±0.05
single_probe_003
MODEL : 61-031047-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Single Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top W Alloy, Nt Plated
Plunger-Bottom Hardned BeCu, Au Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 25.2gf @ 0.50mm
Maximum 32.2gf @ 0.65mm
Pointing Accuracy ±0.06
single_probe_004
MODEL : 60-026046-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Double Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top Hardened BeCu, Au Plated
Plunger-Bottom Hardened BeCu, Au Plated
Spring Stainless Steel, Au Plated

MECHANICAL SPECIFICATIONS

Working 14.8gf @ 0.40mm
Maximum 20.7gf @ 0.60mm
Pointing Accuracy ±0.05
double_probe_001
MODEL : 60-038057-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Double Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top Hardened BeCu, Au Plated
Plunger-Bottom Hardened BeCu, Au Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 24.6gf @ 0.65mm
Maximum 27.7gf @ 0.80mm
Pointing Accuracy ±0.05
double_probe_002
MODEL : 60-053057-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Double Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top Hardened BeCu, Au Plated
Plunger-Bottom Hardened BeCu, Au Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 33.5gf @ 0.97mm
Maximum 37.6gf @ 1.15mm
Pointing Accuracy ±0.06
double_probe_003
MODEL : 60-025038-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Double Probe

MATERIAL & FINISH

Barrel Ni-Au Tube, Au Plated
Plunger-Top W Alloy, Nt Plated
Plunger-Bottom W Alloy, Nt Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 23.2gf @ 0.50mm
Maximum 25.0gf @ 0.60mm
Pointing Accuracy ±0.05
double_probe_004
MODEL : 60-050063-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Double Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top Hardned BeCu, Au Plated
Plunger-Bottom Hardned BeCu, Au Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 10.1gf @ 1.00mm
Maximum 14.7gf @ 1.60mm
Pointing Accuracy ±0.05
double_probe_005
MODEL : 61-038055-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Kelvin Probe

MATERIAL & FINISH

Barrel Phosphor Bronze Tube, Au Plated
Plunger-Top Hardened BeCu, Au Plated
Plunger-Bottom Hardened BeCu, Au Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 31.0gf @ 0.45mm
Maximum 37.6gf @ 0.60mm
Pointing Accuracy ±0.05
kelvin_probe_001
MODEL : 61-011040-00

CLASSIFICATION

Application Semiconductor Test
Probe Type Single Probe

MATERIAL & FINISH

Barrel Ni-Au Tube, Au Plated
Plunger-Top W Alloy, Nt Plated
Plunger-Bottom W Alloy, Nt Plated
Spring Music Wire, Au Plated

MECHANICAL SPECIFICATIONS

Working 7.5gf @ 0.30mm
Maximum 9.2gf @ 0.40mm
Pointing Accuracy ±0.05
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I-3 COATING PROBE

This technology has very low impact on EOS/ESD
and reducing the cleaning cycle by preventing from Sn transition to extend life span of Tip

Au Probe

i3_coating_probe_001

※ Sn Solder Pot Wetting Test (300℃)

I-3 Coating Probe

i3_coating_probe_002

※ Sn Solder Pot Wetting Test (300℃)

i3_coating_probe_003
i3_coating_probe_004
i3_coating_probe_005
I-1 COATING PROBE

Technology to delay the oxidation rate through the harsh
electrolytic test as shown below

Au Probe

I-1 Coating Probe

i1_coating_probe_001